Richard white

Richard White is an Associate at Forensic Engineering International has been working in the optical and electron microscopy field for over 30 years.


BA Communications, Trinity International University

Certificate in Electron Microscopy, AA Natural Science, San Joaquin Delta College

Professional Experience and Appointments

Forensic Engineering International, Associate

TEM manager (for Pasco Washington) at RG Lee, Monroeville, PA

Southeast Regional Manager at EMSL Analytical overseeing five laboratories in the southeast United States.

Laboratory Manager at EMSL Analytical, Atlanta, GA

Laboratory Manager at Materials Analytical Services, Suwanee, GA

Technician at Materials Analytical Services, Suwanee, GA

Technician operating both scanning electron microscopes (SEM) and a transmission electron microscope (TEM) with Lockheed Aeronautical Systems in Marietta, GA

Instrumentation and Product Expertise

  • FEI Quanta 650Scanning Electron Microscope
    • In-situ analysis of diverse samples on large stage
    • Capable of ambient temperatures from -165°C to 1400°C
    • Surface imaging with optional beam deceleration
    • Characterize conductive and non-conductive samples with EDSand EBSD analysis
  • FEI Quanta LV200Scanning Electron Microscope
    • S/TEM detectorfor bright-field and dark-field sample imaging
    • Automated stage control, accommodates large specimens

TEM/ S-TEM (Scanning Transmission Electron Microscopy)

  • FEI Titan
    • 80 – 300kV S-TWIN platform
    • STEM system for FEG configuration, 300 kV kit
    • Resolution: STEM: 0.135 nm; TEM: 0.205 nm
    • r-TEM retractable detector unit for Titan S-TWIN (0.13 Sr collection angle)
    • Low-Dose Exposure Technique
    • Low-Background, Double-Tilt Specimen Holder
    • Old Stage, Double-Tilt Specimen Holder
    • Titan Smart Tilt
    • Gatan 794 Mult-scan Camera (EFTEM)
    • EDAX Spectroscopy
    • Gatan Model 863P Tridiem GIF
    • HAADF Detector
    • Titan Compucentricity
    • Titan Free Lens Control Operating range: 0.5 to 30 kV in 0.1 kV steps

X-Ray Diffraction (XRD)

  • PANalytical X’PertPro MPD
    • X-ray sources: Cu (λ Kα =1.54 Ã) and Cr ( λ Kα = 2.29 Ã) tubes
    • Measurement range: 5- 140 deg
    • Detectors: Xcelerator high-speed line detector able to measure ~2.1 deg 2θ of data simultaneously, which is roughly equivalent to 127 point detectors simultaneously collecting data.
    • Proportional point detector- used mainly for thin film and texture measurements.
    • Sample stages:
      • Spinner,
      • Multiple purpose sample stage (MPSS),
      • Flat bracket,
      • Eulerian cradle for thin films and texture measurements.
    • Bruker Kappa DuoSingle-Crystal CCD Diffractometer
      • APEX II CCD detector
      • X-ray sources: ceramic Mo tube and Cu Incoatec micro source
      • PC computer for data collection control and structure determination
      • Oxford Cryosystems 700 low-temperature device
      • SHELXTL software

X-Ray Computed Tomography (XCT)

  • Xradia MicroXCT-200X-Ray Computed Tomography Instrument
    • Non-destructive 3D imaging
    • High spatial resolution down to <1 µm and pixel size down to 0.56 µm
    • Minimal dependence of resolution on sample size
    • Minimal need for sample preparation
    • Easy navigation through a multiple magnification detector system
    • Continuous operation through automated multiple point tomography and repetitive scanning
    • Robust and low maintenance system
    • High-speed reconstruction